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Direct observation of nanoscale dynamics of ferroelectric degradation
Qianwei Huang, Zibin Chen, Matthew J. Cabral, Feifei Wang, Shujun Zhang, Fei Li, Yulan Li, Simon P. Ringer, Haosu Luo, Yiu-Wing Mai, Xiaozhou Liao
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Article Pages: 1 Open access contents
Author Correction: Nanoscale-femtosecond dielectric response of Mott insulators captured by two-color near-field ultrafast electron microscopy
Xuewen Fu, Francesco Barantani, Simone Gargiulo, Ivan Madan, Gabriele Berruto, Thomas LaGrange, Lei Jin, Junqiao Wu, Giovanni Maria Vanacore, Fabrizio Carbone, Yimei Zhu
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Article Pages: 1 Open access contents
A data reduction and compression description for high throughput time-resolved electron microscopy
Abhik Datta, Kian Fong Ng, Deepan Balakrishnan, Melissa Ding, See Wee Chee, Yvonne Ban, Jian Shi, N. Duane Loh
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Article Pages: 1 Open access contents
Defect-driven selective metal oxidation at atomic scale
Qi Zhu, Zhiliang Pan, Zhiyu Zhao, Guang Cao, Langli Luo, Chaolun Ni, Hua Wei, Ze Zhang, Frederic Sansoz, Jiangwei Wang
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Article Pages: 1 Open access contents
Pushing the limits of high-resolution polymer microscopy using antioxidants
Brooke Kuei, Enrique D. Gomez
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Article Pages: 1 Open access contents
Fundamental Limit of Plasmonic Cathodoluminescence
Franz-Philipp Schmidt, Arthur Losquin, Michal Horák, Ulrich Hohenester, Michael Stöger-Pollach, Joachim R. Krenn
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Article Pages: 6 Open access contents
Direct Imaging of Atomic Permeation Through a Vacancy Defect in the Carbon Lattice
Kecheng Cao, Stephen T. Skowron, Craig T. Stoppiello, Johannes Biskupek, Andrei N. Khlobystov, Ute Kaiser
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Article Pages: 5 Open access contents